
Empowering Global Research through Advanced Instrumentation
From AI to Sustainable Energy, explore the infrastructure at IIT Jodhpur Technology Park.
Beyond the Lab: Designed for Focus
From our ergonomic waiting lounges to our high-energy cafeteria, every square inch of the Tech Park is optimized to support the long hours of breakthrough research.

Waiting Area

Mini Board Room

Cafeteria
Infrastructure and Instruments
The Central Research Facility (CRF) at IIT Jodhpur is a premier hub for high-end scientific analysis. We provide the research community with state-of-the-art technology—from atomic-scale imaging to 3D metal printing—bridging the gap between academic inquiry and industrial innovation
Elemental & Chemical Analysis

ATOMIC ABSORPTION SPECTROMETER
ATOMIC ABSORPTION SPECTROMETER
- Optics: Double Beam
- Photomultiplier: 180-900nm
- Monochromator: Escelle type
- Lamp Carousel: 6 lamp coded, auto aligning
- Software: iCE SOLAAR AA
- Integrated Graphite Furnace and Auto-sampler Module

ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
- Analysis Range: Sodium (Na) to Americium (Am).
- Concentration Range: 100 % to ppm level.
- Sample Form: Solid, liquid, Powder, Paste.
- X-Ray Source: Ag anode target (15W).
- Tube Filters: Six, Software selectable (Blank, Cu 300 μm, Cu 500 μm, Al 50 μm, Al 200 μm, Ti 7 μm, Ag 100 μm)
- Detector: Silicon Drift detector

INDUCTIVELY COUPLED PLASMA- MASS SPECTROMETER
INDUCTIVELY COUPLED PLASMA- MASS SPECTROMETER
- Mass Range Up to 260 amu
- Interface Ni/Cu cones (standard), optional Pt cones for high matrix tolerance
- Detector Dual-stage discrete dynode electron multiplier with 109 dynamic range
- Sensitivity >1,000,000 cps/ppm for 89Y
- Background < 1 cps (with shield torch)
- Oxide Ratio (CeO+/Ce+) < 0.5%
- Doubly Charged Ratio (Ba2+/Ba+) < 15%
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HIGH PERFORMANCE LIQUID CHROMATOGRAPHY
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY
- Flow rate range: 0.010 to 10.000 mL/min in 0.001 mL/min increments
- Maximum operating pressure: 4500 Psi
- Number of solvents: 2
- Operating temperature: Room Temperature
- Available column: C18
- Mode of operation: Reverse Phase
- Detector: Versatile dual wavelength UV absorbance detector

FTIR SPECTROMETER
FTIR SPECTROMETER
- FT-IR System: Fully automatic
- Nature of sample to be Analyzed: Solid, Thin film and Liquid.
- Spectral range: Up to 6000 cm-1 or better with Diamond ATR
- Spectral Resolution: 2 cm-1
- ATR System: Diamond ATR
- Beam Splitter: KBr
- IR-Source: Central Glow Technology/Laser source
- Detector: DTGS

HIGH RESOLUTION MASS SPECTROMETER
HIGH RESOLUTION MASS SPECTROMETER
- In-spectra Dynamic Range: 5 Orders
- Ion Source: •Dual-AJS MultiMode (ESI+APCI)
- •Dual-ESI GC/APCI
- •APCI NanoESI
- Isotope Fidelity: <5 %
- MS Acquisition Rate: 50 spectra/second
- MS Mass Accuracy (negative): <0.8 ppm RMS
- MS Mass Accuracy (positive): <0.8 ppm RMS
- MS Sensitivity (positive): S/N (RMS) > 500:1 Measured with 1pg

GAS CHROMATOGRAPHY
GAS CHROMATOGRAPHY
- Detectors: 1 (FID)
- Dimensions (WxDxH): 58 cm x 54 cm x 49 cm
- GC Detector MDLs: Standard
- GC Diagnostics - Leak Check: Standard (manually cap septum purge)
- GC/MS Compatibility: Single quadrupole (stainless steel source)
- Inlets: 1
- Maximum Temperature Ramp Rate: 75 °C/min
Microscopy & Imaging

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE
- (1) ULTRASONIC DISC CUTTER
- (2) DISK PUNCH
- (3) DISC GRINDER
- (4) DIAMOND WIRE SAW
- (5) DIMPLER GRINDER
- (6) ION BEAM MILLING SYSTEM

SCANNING ELECTRON MICROSCOPE WITH EDAX
SCANNING ELECTRON MICROSCOPE WITH EDAX
- Filament: Tungsten
- Secondary e-image resolution: 3 nm 30 Kv (Standard Sample)
- Tilt: -10 to + 90 Degree
- EHT: 30kV
- Magnification: Up to 50K ~ 100K (Depends on sample)
- Process Capabilities: Imaging Modes: Surface & Cross-Sectional
- Sample Holder: Maximum 9 stubs (~1 CM Dia.) can be mounted
- EDX: Elemental Mapping
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IMAGE ENABLED FLUORESCENCE ACTIVATED CELL SORTER
IMAGE ENABLED FLUORESCENCE ACTIVATED CELL SORTER
- Lasers:
- Ultraviolet laser (349 nm)
- Violet laser (405 nm)
- Blue laser (488 nm)
- Yellow-green laser (561 nm)
- Red laser (638 nm)
- Configurations:
- Number of spectral lasers: 5
- Number of fluorescent detectors: 78
- Total Detectors: 86

SEM SPUTTER COATER FOR METAL COATING
SEM SPUTTER COATER FOR METAL COATING
- Coating target material: Au, Au/Pd, Au/Pt, Pt, Pt/Pd
- Sputtering current: 5-40mA
- Specimen holder to target distance: 20-80mm
- Sputtering Time: 5-300sec
Material & Thermal Characterization

PHYSICAL PROPERTY MEASUREMENT SYSTEM
PHYSICAL PROPERTY MEASUREMENT SYSTEM
- PPMS Experimental Parameters-
- Operational Modes Currently Available: Electrical Transport (AC and DC), Vibrating Sample Magnetometer (VSM)
- Temp. Range - 6.0 K to 370 K, Magnetic Field - 0 to 9 Tesla

DIFFERENTIAL SCANNING CALORIMETRY
DIFFERENTIAL SCANNING CALORIMETRY
- Measurement Principle: Heat Flux
- Furnace Material: Alumina-coated aluminum
- Temperature Sensors: Thermocouple-based. Machined disc of Chromyl alloy (90% Ni, 10% Cr)
- Temperature Range: -100 °C to 450 °C
- Heating/Cooling Rate: 0.1 to 100 °C per minute
- Purge Gases: Nitrogen, Argon

SIMULTANEOUS THERMAL ANALYZER
SIMULTANEOUS THERMAL ANALYZER
- Temperature Range: 15 °C to 1000 °C
- Heating: 0.1 to 100 °C per minute
- Thermocouple: PT-PT/Rh(Type R)

RHEOMETER
RHEOMETER
- Peltier Temperature device (plate) [Temp. Range: -50oC to +220oC] with (a) Cone plate measuring system, (b) Parallel plate measuring system
- Peltier Temperature device (cylindrical) [Temp. Range: -30oC to 200oC] with (a) Concentric cylinder System, (b) Double-gap measuring system
- Convection Temperature Device (CTD): CTD is compatible with Rotational Drive [Temp. Range: -160oC to 600oC]

CHEMISORPTION ANALYSER
CHEMISORPTION ANALYSER
- Temperature-programmed techniques, including temperature-programmed desorption (TPD), temperature-programmed oxidation (TPO), temperature-programmed reduction (TPR), temperature-programmed reaction (TPRx)
- Typical sample size: 0.1 to 1 g
- Standard temperature range: -130 deg.C to 1100 °C, Standard pressure range: up to atmospheric pressure

BET SURFACE AREA & PORE SIZE ANALYSER
BET SURFACE AREA & PORE SIZE ANALYSER
- Operate with any non-corrosive adsorbate and a wide variety of coolants. Dedicated helium input port and backfill gas input port.
- High sensitivity is ensured by multiple pressure transducers, minimum void volume and accurate coolant level control.
- It can also calculate the total pore volume of the sample.
- Mode of use: Nitrogen at 77K
- Sample required: 200 mg

ELECTROCHEMICAL WORKSTATION
ELECTROCHEMICAL WORKSTATION
- • Zero resistance ammeter
- • 2- or 3- or 4-electrode configuration
- • Maximum potential: ±10 V for both channels
- • Maximum current: ± 250 mA continuous (sum of two current channels), ±300 mA peak
- • Compliance Voltage: ±13 V
- • Potentiostat bandwidth (-3 dB): 1 MHz

CONTACT ANGLE METER
CONTACT ANGLE METER
- Measurement Range: 0 to 1800
- Resolution: 0.010 to 0.10
- Accuracy: +/- 0.050 to +/- 10
- Camera Speed: 30 to 3000 + fps
- Dosing Accuracy: 0.01uL to 0.1 uL

ELECTROSYN
ELECTROSYN
- Functionality: Electrosynthesis
- Stirring Speed: 50 - 1500 rpm (10 rpm accuracy)
- Electrode Current Output: 100 mA.
- Electrode Voltage Output: 30/10 V.
- Stirring Bar Length: 8 - 16 mm
Structural & Molecular Identification

NUCLEAR MAGNETIC RESONANCE
NUCLEAR MAGNETIC RESONANCE
- Specifications:
- Frequency: 500 MHz
- Magnetic Field: 11.7 Tesla
- Probes/Accessories available:
- BBFO Probe (Liquid State): Broad Band Fluorine observe
- TBI Probe (Liquid State)
- Diffusion Probe

RAMAN SPECTROMETER
RAMAN SPECTROMETER
- Equipped with three excitation lasers: 355 nm, 532 nm, and 785 nm.
- Measures Raman shift from 50 to 4000 cm-1.
- Used for identifying chemical bonds, determining phases (symmetry), analyzing stress/strain, and probing electronic structure of nanomaterials.
- Can analyse thin films, solid pellets, and powdered samples.
- Objective lenses of 10X, 20X, 50X, and 100X magnification.

POWDER X-RAY DIFFRACTOMETER
POWDER X-RAY DIFFRACTOMETER
- Instrument Type: Multipurpose X-ray Diffractometer
- Sample Compatibility: Powders, thin films, nanomaterials, solid objects
- Dimensions: 1400 mm (W) × 1162 mm (D) × 1947 mm (H)
- Core Components: X-ray Source
- X-ray Generator: High-stability generator with integrated tube housing
- Supported Anode Materials: Cu, Mo, Ag, Co, Fe, Mn, Cr

DYNAMIC LIGHT SCATTERING
DYNAMIC LIGHT SCATTERING
- Particle Size distribution-Range: 0.3 nm to 10 μm.
- Zeta Potential: No effective limitation for zeta potential range; Size range from 3.8 nm to 100 μm.
- Maximum sample conductivity is 260 mS/cm with accuracy ± 10 %.
- Source: He Ne Gas Laser (wavelength 632.8 nm) having output power 4 mW.
- Detector: Avalanche Photodiode with QE > 50%

FLUORESCENCE SPECTROMETER
FLUORESCENCE SPECTROMETER
- Fluorescence, Phosphorescence, Chemiluminescence, and bioluminescence analyser
- Source: Xenon discharge Lamp
- Monochromators: Monk Gillieson type monochromator
- Excitation 200-800nm with zero-order selectable. Emission 200-650nm with a standard photomultiplier
- Temperature Range: 0-100 degree C. Set at 20 degree C.

TIME RESOLVED PHOTOLUMINESCENCE
TIME RESOLVED PHOTOLUMINESCENCE
- 450 W Xenon lamp with integrated power supply for Steady-State PL measurements
- 400nm, 100 mW CW Laser (Class 3B) for Steady State PL measurements
- 405nm Picosecond Diode Laser (Class 3R)
- 280nm Picosecond Pulsed LED (Class 3B)
- Working Excitation Range for PL with Xenon Lamp: ~240 nm- 900 nm
- PMT-800 Detector, in-cooled housing
- Standard Sample Holder

FT-IR (Bruker Alpha II & Agilent Carry 630)
FT-IR (Bruker Alpha II & Agilent Carry 630)
- Spectral range 350 - 8,000 cm-1, with standard KBr beam splitter 500 - 6,000 cm-1, option: „High Humidity“ ZnSe optics
- Source Mid IR source
- Wavenumber accuracy <0.05 cm-1 @ 2,000 cm-1
- Signal-to-noise ratio Typically >55,000:1 (1 min measurement time, spectral resolution 4 cm-1)
- Beam splitter ZnSe
- Reference Laser Solid state laser

UV-VIS SPECTROPHOTOMETER
UV-VIS SPECTROPHOTOMETER
- Control Software Cary Win UV for UV-Vis Applications, M.Wave Professional(lab India)
- Light Source Halogen lamp, Deuterium lamp
- Maximum Scanning Speed UV-Vis 8,000 nm/min
- Photometric Range (Abs) ~3 Abs
- Photometric System Double beam
- Power Requirements 100-240 VAC, 50/60 Hz
- Spectral Bandwidth 1 nm
- Wavelength 175 - 900 nm
- Detector Silicon photodiode

FLUORESCENCE SPECTROEMETER
FLUORESCENCE SPECTROEMETER
- Source Xenon lamp
- Monochromators Excitation 200-750 nm with zero order selectable
- Emission 200-750 nm with zero order selectable
- Wavelength accuracy + 1 nm
- Scanning speed The scanning speed can be selected in increments of 1 nm from 10-1500 nm/minute. Data can also be collected with respect to time.
- Spectral bandpass The excitation slits 2.5-15 nm and emission slits 2.5-20 nm
Advanced Manufacturing (3D Printing)

SELECTIVE LASER MELTING (LASER 3D PRINTING)
SELECTIVE LASER MELTING (LASER 3D PRINTING)
- Build volume: 325mm x 325mm x 420mm
- Substrate heating: 200°C
- Laser Power: 500 Watts
- Laser type: Yb Fiber lasers.
- Wavelength: 1070 nm
- Scan Speed: 7 m/s
- Diameter at focus (Micron): 80 – 100 microns
- Software: AM Builder (Integrated) - Build Processing Software

ELECTRON BEAM MELTING
ELECTRON BEAM MELTING
- Cathode Type: Tungsten filament
- Extremely high process temperatures, up to 1100° C.
- Start plate: 170x170, 210x210 mm2
- Max. EB translation speed: 8 m/s
- Build atmosphere: He consumption: build process 1 liter/h, Pressure: 0.8 kg/cm3
- CAD interface Standard: STL
- Layer thickness: 50 microns
- Software: Materialize Magics 28.02 & Build Processor 3.3.00001.0, EBM control 5, Log studio 4
- Powder size distribution: 45-120 μm